Semiconductor and integrated circuit developments continue to proceed at an incredible pace. For example, today’s application-specific ICs and microprocessors can contain upwards of 100 million transistors. Traditional testing relies on the stuck-at-fault (SAF) to model defect behavior. Unfortunately, the SAF model is a poor model for defects. Other models and strategies are required to catch killer defects on integrated circuits. As transistor sizes decrease, the types and properties of the killer defects change. This has created a number of challenges related to the testing of components. Defect-Based Testing is a 2-day course that offers detailed instruction on the electrical behavior and test strategies for integrated circuits. We place special emphasis on electrical behavior, fault models, and test techniques. This course is a must for every manager, engineer, and technician working in IC test, IC design, or supplying test hardware and software tools to the industry.

By focusing on the fundamentals of circuit behavior and the impact of defects on circuit behavior, participants will learn how to design, write, and implement test strategies to catch defects. Our instructors work hard to explain semiconductor test without delving heavily into the complex algorithms and computer science that normally accompany this discipline.